Fault diagnosis of analog integrated circuits /
Kabisatpathy, Prithviraj.
Fault diagnosis of analog integrated circuits / by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha. - ix, 182 pages : illustrations ; 25 cm - FRET 30 . - Frontiers in electronic testing v. 30 .
Includes bibliographical references and index.
Introduction -- Basic test issues -- Introduction -- A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme -- Introduction -- The diagnosis procedure -- The test stimulus generation -- The fault modelling -- Approximation modelling of the analogue integrated circuits -- Artificial neural networks: an overview -- Summary and conclusions -- Fault Diagnosis in Stand-alone Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained --
Fault Diagnosis in Embedded Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained -- Experimental Verification of the Fault Diagnosis Methodology -- Introduction -- The hardware realisation -- Experimental results -- Discussion on the results obtained -- Conclusions -- Results and discussions -- Appendix. A.Typical BJT SPICE parameter values of the µA741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp -- Bibliography.
038725742X (hd.bd.)
9780387257426 (hd.bd.)
2006275156
Linear integrated circuits.
Linear integrated circuits--Testing.
TK7874.654 / .K335 2005
621.3815 / K.P.F
Fault diagnosis of analog integrated circuits / by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha. - ix, 182 pages : illustrations ; 25 cm - FRET 30 . - Frontiers in electronic testing v. 30 .
Includes bibliographical references and index.
Introduction -- Basic test issues -- Introduction -- A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme -- Introduction -- The diagnosis procedure -- The test stimulus generation -- The fault modelling -- Approximation modelling of the analogue integrated circuits -- Artificial neural networks: an overview -- Summary and conclusions -- Fault Diagnosis in Stand-alone Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained --
Fault Diagnosis in Embedded Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained -- Experimental Verification of the Fault Diagnosis Methodology -- Introduction -- The hardware realisation -- Experimental results -- Discussion on the results obtained -- Conclusions -- Results and discussions -- Appendix. A.Typical BJT SPICE parameter values of the µA741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp -- Bibliography.
038725742X (hd.bd.)
9780387257426 (hd.bd.)
2006275156
Linear integrated circuits.
Linear integrated circuits--Testing.
TK7874.654 / .K335 2005
621.3815 / K.P.F