MARC details
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06629cam a2200349 i 4500 |
| 001 - CONTROL NUMBER |
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16733595 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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20200928153448.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
110413s2012 flua b 001 0 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
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| LC control number |
2011010401 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9781439818459 (hardcover : alk. paper) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
1439818452 (hardcover : alk. paper) |
| 040 ## - CATALOGING SOURCE |
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| Original cataloging agency |
DLC |
| Transcribing agency |
DLC |
| Modifying agency |
YDX |
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BTCTA |
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YDXCP |
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UKMGB |
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BWX |
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CDX |
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COO |
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DEBBG |
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OCLCQ |
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DLC |
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EG-NcFUE |
| Description conventions |
rda |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER |
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| Classification number |
TK7895.E42 |
| Item number |
M636 2012 |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
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| Classification number |
004.1 |
| Edition number |
22 |
| Item number |
M |
| 245 00 - TITLE STATEMENT |
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| Title |
Model-based testing for embedded systems / |
| Statement of responsibility, etc |
edited by Justyna Zander, Ina Schieferdecker, and Pieter J. Mosterman. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
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| Place of publication, distribution, etc |
Boca Raton : |
| Name of publisher, distributor, etc |
CRC Press, |
| Date of publication, distribution, etc |
c2012. |
| 300 ## - PHYSICAL DESCRIPTION |
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| Extent |
xxvii, 660 pages. : |
| Other physical details |
illustration ; |
| Dimensions |
26 cm. |
| 336 ## - CONTENT TYPE |
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| Source |
rdacontent |
| Content type term |
text |
| 337 ## - MEDIA TYPE |
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| Source |
rdamedia |
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unmediated |
| 338 ## - CARRIER TYPE |
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| Source |
rdacarrier |
| Carrier type term |
volume |
| 490 0# - SERIES STATEMENT |
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| Series statement |
Computational analysis, synthesis, and design of dynamic systems |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
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| Bibliography, etc |
Includes bibliographical references and index. |
| 505 0# - FORMATTED CONTENTS NOTE |
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| Formatted contents note |
Part I: Introduction<br/><br/><br/><br/><br/><br/>A Taxonomy of Model-Based Testing for Embedded Systems from Multiple Industry Domains, J. Zander, I. Schieferdecker, and P.J. Mosterman<br/><br/><br/><br/><br/><br/>Behavioral System Models versus Models of Testing Strategies in Functional Test Generation, A. Huima<br/><br/><br/><br/><br/><br/>Test Framework Architectures for Model-Based Embedded System Testing, S.P. Masticola and M. Gall<br/><br/><br/><br/><br/><br/><br/><br/><br/>Part II: Automatic Test Generation<br/><br/><br/>Automatic Model-Based Test Generation from UML State Machines, S. Weissleder and H. Schlingloff<br/><br/><br/><br/><br/><br/>Automated Statistical Testing for Embedded Systems, J.H. Poore, L. Lin, R. Eschbach, and T. Bauer<br/><br/><br/><br/><br/><br/>How to Design Extended Finite State Machine Test Models in Java, M. Utting<br/><br/><br/><br/><br/><br/>Automatic Testing of LUSTRE/SCADE Programs, V. Papailiopoulou, B. Seljimi, and I. Parissis<br/><br/><br/><br/><br/><br/>Test Generation Using Symbolic Animation of Models, F. Dadeau, F. Peureux, B. Legeard, R. Tissot, J. Julliand, P.-A. Masson, and F. Bouquet<br/><br/><br/><br/><br/><br/><br/><br/><br/>Part III: Integration and Multi-level Testing<br/><br/><br/><br/><br/><br/>Model-Based Integration Testing with Communication Sequence Graphs, F. Belli, A. Hollmann, and S. Padberg<br/><br/><br/><br/><br/><br/>A Model-Based View onto Testing: Criteria for the Derivation of Entry Tests for Integration Testing, M. Broy and A. Pretschner<br/><br/><br/><br/><br/><br/>Multilevel Testing for Embedded Systems, A. Marrero Perez and S. Kaiser<br/><br/><br/><br/><br/><br/>Model-Based X-in-the-Loop Testing, J. Grossmann, P. Makedonski, H.-W. Wiesbrock, J. Svacina, I. Schieferdecker, and J. Grabowski<br/><br/><br/><br/><br/><br/><br/><br/><br/>Part IV: Specific Approaches<br/><br/><br/><br/><br/><br/>A Survey of Model-Based Software Product Lines Testing, S. Oster, A. Wubbeke, G. Engels, and A. Schoerr<br/><br/><br/><br/><br/><br/>Model-Based Testing of Hybrid Systems, T. Dang<br/><br/><br/><br/><br/><br/>Reactive Testing of Nondeterministic Systems by Test Purpose-Directed Tester, J. Vain, A. Kull, M. Kaaramees, M. Markvardt, and K. Raiend<br/><br/><br/><br/><br/><br/>Model-Based Passive Testing of Safety-Critical Components, S. Gruner and B. Watson<br/><br/><br/><br/><br/><br/><br/><br/><br/>Part V: Testing in Industry<br/><br/><br/><br/><br/><br/>Applying Model-Based Testing in the Telecommunication Domain, F. Abbors, V.-M. Aho, J. Koivulainen, R. Teittinen, and D. Truscan<br/><br/><br/><br/><br/><br/>Model-Based GUI Testing of Smartphone Applications: Case S60 (TM) and Linux (R), A. Jaaskelainen, T. Takala, and M. Katara<br/><br/><br/><br/><br/><br/>Model-Based Testing in Embedded Automotive Systems, P. Skruch, M. Panek, and B. Kowalczyk<br/><br/><br/><br/><br/><br/><br/><br/><br/>Part VI: Testing at the Lower Levels of Development<br/><br/><br/><br/><br/><br/>Testing-Based Translation Validation of Generated Code, M. Conrad<br/><br/><br/><br/><br/><br/>Model-Based Testing of Analog Embedded Systems Components, L. Barford<br/><br/><br/><br/><br/><br/>Dynamic Verification of SystemC Transactional Models, L. Pierre and L. Ferro<br/> |
| 520 ## - SUMMARY, ETC. |
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| Summary, etc |
This book explores model-based testing from a number of different perspectives. Combining various aspects of embedded systems and software 'and their how they are applied 'it covers theory and practice concerning the test specification and validation of complex software-intensive embedded systems. Model-based testing refers to software testing in which test cases are either wholly or partially derived from a model, illustrating selected aspects of a system under test. Detailed examples from industry provide solutions that are applicable in real-world testing practices. The text provides a better understanding of system and software quality problems, as well as the entire test process.<br/>What the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used and validated techniques, along with new ideas for solving hard problems. "It is rare that a book can take recent research advances and present them in a form ready for practical use, but this book accomplishes that and more. I am anxious to recommend this in my consulting and to teach a new class to my students." 'Dr. Jeff Offutt, professor of software engineering, George Mason University, Fairfax, Virginia, USA "This handbook is the best resource I am aware of on the automated testing of embedded systems. It is thorough, comprehensive, and authoritative. It covers all important technical and scientific aspects but also provides highly interesting insights into the state of practice of model-based testing for embedded systems." 'Dr. Lionel C. Briand, IEEE Fellow, Simula Research Laboratory, Lysaker, Norway, and professor at the University of Oslo, Norway "As model-based testing is entering the mainstream, such a comprehensive and intelligible book is a must-read for anyone looking for more information about improved testing methods for embedded systems. Illustrated with numerous aspects of these techniques from many contributors, it gives a clear picture of what the state of the art is today." 'Dr. Bruno Legeard, CTO of Smartesting, professor of Software Engineering at the University of Franche-Comt , Besan on, France, and co-author of Practical Model-Based Testing |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name as entry element |
Embedded computer systems |
| General subdivision |
Testing. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Zander, Justyna. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Schieferdecker, Ina. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
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| Personal name |
Mosterman, Pieter J. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Koha item type |
Books |
| Source of classification or shelving scheme |
Dewey Decimal Classification |