Characterization in compound semiconductor processing / editors, Yale Strausser and Gary E. McGuire ; consulting editor, C.R. Brundle ; managing editor, Lee E. Fitzpatrick.
Material type:
TextSeries: Materials characterization seriesPublisher: Boston : Greenwich : Butterworth-Heinemann ; Manning, [2010]Publisher: c2010Description: xiv, 199 pages : illustartions ; 25 cmContent type: - text
- unmediated
- volume
- 9781606500415 (hb)
- 1606500414 (hb)
- 9781606500439 (ebk.)
- 1606500430 (ebk.)
- 621.38152 22 C.
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
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Main library B3 | Faculty of Engineering & Technology (Electrical) | 621.38152 C. (Browse shelf(Opens below)) | Available | 00011470 |
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| 621.3815 T.C.L Linear circuit analysis / | 621.3815 W.W.M Millimeter-wave digitally intensive frequency generation in CMOS / | 621.38152 A.B.F Fundamentals of semiconductor devices / | 621.38152 C. Characterization in compound semiconductor processing / | 621.38152 C.J.P. Power electronics / | 621.38152 K.K.S Semiconductor devices / | 621.38152 L.S.P Power semiconductors / |
Includes bibliographical references and index.
Characterization of III-V thin films for electronic devices /
J.N. Miller and T.S. Low -- III-V compound semiconductor films for optical applications / Thomas F. Kuech --
Contacts / T. Sands and S.A. Schwarz --
Dielectric insulating layers / H.H. Wieder --
Other compound semiconductor films / Owen K. Wu and David R. Rhiger --
Deep level transient spectroscopy : a case study on GaAs / Werner K. Götz and Noble M. Johnson.
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