TY  - BOOK
AU  - Crouch,Alfred L.
TI  - Design-for-test for digital IC's and embedded core systems
SN  - 0130848271
U1  - 621.3815 21
PY  - 1999///]
CY  - Upper Saddle River, NJ
PB  - Prentice Hall PTR
KW  - Digital integrated circuits
KW  - Design and construction
KW  - Electronic circuit design
KW  - Automatic test equipment
KW  - Embedded computer systems
N1  - Includes bibliographical references and index; 1. Test and Design-for-Test Fundamentals. -- 2. Automatic Test Pattern Generation Fundamentals -- 3. Scan Architectures and Techniques -- 4. Memory Test Architectures and Techniques. -- 5. Embedded Core Test Fundamentals
ER  -