TY  - BOOK
AU  - Kabisatpathy,Prithviraj
AU  - Barua,Alok
AU  - Sinha,Satyabroto
TI  - Fault diagnosis of analog integrated circuits
T2  - FRET
SN  - 038725742X (hd.bd.)
AV  - TK7874.654 .K335 2005
U1  - 621.3815 22
PY  - 2005///]
CY  - Dordrecht
PB  - Springer
KW  - Linear integrated circuits
KW  - Testing
N1  - Includes bibliographical references and index; Introduction -- Basic test issues -- Introduction -- A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme -- Introduction -- The diagnosis procedure -- The test stimulus generation -- The fault modelling -- Approximation modelling of the analogue integrated circuits -- Artificial neural networks: an overview -- Summary and conclusions -- Fault Diagnosis in Stand-alone Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained --
Fault Diagnosis in Embedded Analogue Integrated Circuits -- Introduction -- The testing methodology --  Simulation results -- Discussion on the results obtained -- Experimental Verification of the Fault Diagnosis Methodology -- Introduction -- The hardware realisation -- Experimental results -- Discussion on the results obtained -- Conclusions -- Results and discussions -- Appendix. A.Typical BJT SPICE parameter values of the µA741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp -- Bibliography

UR  - http://repository.fue.edu.eg/xmlui/handle/123456789/3919
ER  -