TY  - BOOK
AU  - Strausser,Yale
AU  - McGuire,G.E.
TI  - Characterization in compound semiconductor processing
T2  - Materials characterization series
SN  - 9781606500415 (hb)
U1  - 621.38152 22
PY  - 2010///]
CY  - Boston, Greenwich
PB  - Butterworth-Heinemann, Manning
KW  - Compound semiconductors
KW  - Surfaces
N1  - Includes bibliographical references and index; Characterization of III-V thin films for electronic devices /
; J.N. Miller and T.S. Low --; III-V compound semiconductor films for optical applications /; Thomas F. Kuech --
; Contacts /; T. Sands and S.A. Schwarz --
; Dielectric insulating layers /; H.H. Wieder --
; Other compound semiconductor films /; Owen K. Wu and David R. Rhiger --
; Deep level transient spectroscopy : a case study on GaAs /; Werner K. Götz and Noble M. Johnson
ER  -