000			03048nam a2200421 i 4500
999			_c2363 _d2363
001			14531518
005			20201214144528.0
008			060901s2007 flua f b 001 0 eng d
010			_a 2006029159
015			_aGBA708488 _2bnb
016	7		_a013655968 _2Uk
020			_a9780849374975 (alk. paper)
020			_a0849374979 (alk. paper)
035			_a(OCoLC)ocm71286650
035			_a(OCoLC)71286650
040			_aDLC _erda _cDLC _dBAKER _dC#P _dYDXCP _dUKM _dNLGGC _dDLC _beng
082	0	0	_a621.381 _222 _bS.S.E.
100	1		_aSangwine, Stephen. _99758 _eauthor.
245	1	0	_aElectronic components and technology / _cStephen Sangwine.
250			_a3rd edtion
264		1	_aBoca Raton : _bCRC Press, _c[2007]
264		4	_c©2007
300			_axiii, 214 pages : _billustrations ; _c26 cm
336			_atext _btxt _2rdacontent
337			_aunmediated _bn _2rdamedia
338			_avolume _bnc _2rdacarrier
490	1		_aTutorial guides in electronic engineering
504			_aIncludes bibliographical references (pages 201-202) and index.
505	0		_aINTRODUCTION -- INTERCONNECTION TECHNOLOGY -- Jointing -- Discrete Wiring -- Cables -- Connectors -- Printed Circuits -- Printed Circuit Assembly -- Rework and Repair -- Case Study: A Temperature Controller -- INTEGRATED CIRCUITS -- Review of Semiconductor Theory -- Integrated Circuit Fabrication -- Semiconductor Packaging -- Handling of Semiconductor Devices -- Custom Integrated Circuits -- POWER SOURCES AND POWER SUPPLIES -- Energy Sources -- Batteries -- Power Supplies -- PASSIVE ELECTRONIC COMPONENTS -- Passive Component Characteristics -- Resistors -- Capacitors -- Inductors -- INSTRUMENTS AND MEASUREMENT -- Quantities to be Measured -- Voltage and Current Measurement -- Frequency and Time Measurement -- Waveforms-The Oscilloscope -- HEAT MANAGEMENT -- Heat Transfer -- Convection -- Radiation -- Thermal Resistance -- Heat Sinking -- Forced Cooling -- Advanced Heat-Removal Techniques -- PARASITIC ELECTRICAL AND ELECTROMAGNETIC EFFECTS -- Parasitic Circuit Elements -- Distributed-Parameter Circuits -- Electromagnetic Interference -- Applications Studies -- RELIABILITY AND MAINTAINABILITY -- Failure -- The 'Bathtub' Curve -- Measures of Reliability and Maintainability -- High-Reliability Systems -- Maintenance -- ENVIRONMENTAL FACTORS AND TESTING -- Environmental Factors -- Type Testing -- Electronic Production Testing -- SAFETY -- Electric Shock -- Other Safety Hazards -- Design for Safety -- REFERENCES -- ANSWERS TO PROBLEMS -- INDEX
650		0	_aElectronic apparatus and appliances.
650		0	_aMicroelectronics.
856	4	1	_3Table of contents only _uhttp://www.loc.gov/catdir/toc/ecip0620/2006029159.html
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0745/2006029159-d.html
906			_a7 _bcbc _corignew _d1 _eecip _f20 _gy-gencatlg
942			_2ddc _cBK