000			01645cam a22003494i 4500
999			_c2369 _d2369
001			2630293
005			20210125135342.0
008			990416s1999 njua b 001 0 eng
020			_a0130848271
040			_aDLC _erda _cDLC _dDLC _beng
082	0	0	_a621.3815 _221 _bC.A.D
100	1		_aCrouch, Alfred L. _99777 _eauthor.
245	1	0	_aDesign-for-test for digital IC's and embedded core systems / _cAlfred L. Crouch.
264		1	_aUpper Saddle River, NJ : _bPrentice Hall PTR, _c[1999]
264		4	_c©1999
300			_axxvii, 349 pages : _billustrations ; _c25 cm. + _e1 computer laser optical disc (4 3/4 inch)
336			_atext _btxt _2rdacontent
337			_aunmediated _bn _2rdamedia
338			_avolume _bnc _2rdacarrier
504			_aIncludes bibliographical references and index.
505	0		_a1. Test and Design-for-Test Fundamentals. -- 2. Automatic Test Pattern Generation Fundamentals -- 3. Scan Architectures and Techniques -- 4. Memory Test Architectures and Techniques. -- 5. Embedded Core Test Fundamentals.
538			_aSystem requirements for accompanying computer disc: UNIX ; Microsoft Windows.
650		0	_aDigital integrated circuits _xDesign and construction.
650		0	_aElectronic circuit design.
650		0	_aAutomatic test equipment.
650		0	_aEmbedded computer systems _xDesign and construction.
906			_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg
942			_2ddc _cBK