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| 001 | 14359750 | ||
| 005 | 20201228113528.0 | ||
| 008 | 060501s2005 ne a b 001 0 eng d | ||
| 010 | _a 2006275156 | ||
| 020 | _a038725742X (hd.bd.) | ||
| 024 | 3 | _a9780387257426 (hd.bd.) | |
| 040 |
_aOHX _cOHX _dBAKER _dHNK _dNLGGC _dDLC _erda |
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| 050 | 0 | 0 |
_aTK7874.654 _b.K335 2005 |
| 082 | 0 | 0 |
_a621.3815 _222 _bK.P.F |
| 100 | 1 |
_aKabisatpathy, Prithviraj. _926598 _eauthor. |
|
| 245 | 1 | 0 |
_aFault diagnosis of analog integrated circuits / _cby Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha. |
| 264 | 1 |
_aDordrecht : _bSpringer, _c[2005] |
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| 300 |
_aix, 182 pages : _billustrations ; _c25 cm |
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| 336 |
_2rdacontent _atext |
||
| 337 |
_2rdamedia _aunmediated |
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| 338 |
_2rdacarrier _avolume |
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| 490 | 1 |
_aFRET _v30 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | _aIntroduction -- Basic test issues -- Introduction -- A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme -- Introduction -- The diagnosis procedure -- The test stimulus generation -- The fault modelling -- Approximation modelling of the analogue integrated circuits -- Artificial neural networks: an overview -- Summary and conclusions -- Fault Diagnosis in Stand-alone Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained -- Fault Diagnosis in Embedded Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained -- Experimental Verification of the Fault Diagnosis Methodology -- Introduction -- The hardware realisation -- Experimental results -- Discussion on the results obtained -- Conclusions -- Results and discussions -- Appendix. A.Typical BJT SPICE parameter values of the µA741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp -- Bibliography. | |
| 650 | 0 |
_aLinear integrated circuits. _926599 |
|
| 650 | 0 |
_aLinear integrated circuits _xTesting. _926600 |
|
| 700 | 1 |
_aBarua, Alok. _926601 _eauthor. |
|
| 700 | 1 |
_aSinha, Satyabroto. _926602 _eauthor. |
|
| 830 | 0 |
_aFrontiers in electronic testing _vv. 30 _926603 |
|
| 856 |
_3Abstract _uhttp://repository.fue.edu.eg/xmlui/handle/123456789/3919 |
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| 942 |
_cBK _2ddc |
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