000 02408cam a22003737i 4500
999 _c5345
_d5345
001 14359750
005 20201228113528.0
008 060501s2005 ne a b 001 0 eng d
010 _a 2006275156
020 _a038725742X (hd.bd.)
024 3 _a9780387257426 (hd.bd.)
040 _aOHX
_cOHX
_dBAKER
_dHNK
_dNLGGC
_dDLC
_erda
050 0 0 _aTK7874.654
_b.K335 2005
082 0 0 _a621.3815
_222
_bK.P.F
100 1 _aKabisatpathy, Prithviraj.
_926598
_eauthor.
245 1 0 _aFault diagnosis of analog integrated circuits /
_cby Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha.
264 1 _aDordrecht :
_bSpringer,
_c[2005]
300 _aix, 182 pages :
_billustrations ;
_c25 cm
336 _2rdacontent
_atext
337 _2rdamedia
_aunmediated
338 _2rdacarrier
_avolume
490 1 _aFRET
_v30
504 _aIncludes bibliographical references and index.
505 0 _aIntroduction -- Basic test issues -- Introduction -- A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme -- Introduction -- The diagnosis procedure -- The test stimulus generation -- The fault modelling -- Approximation modelling of the analogue integrated circuits -- Artificial neural networks: an overview -- Summary and conclusions -- Fault Diagnosis in Stand-alone Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained -- Fault Diagnosis in Embedded Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained -- Experimental Verification of the Fault Diagnosis Methodology -- Introduction -- The hardware realisation -- Experimental results -- Discussion on the results obtained -- Conclusions -- Results and discussions -- Appendix. A.Typical BJT SPICE parameter values of the µA741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp -- Bibliography.
650 0 _aLinear integrated circuits.
_926599
650 0 _aLinear integrated circuits
_xTesting.
_926600
700 1 _aBarua, Alok.
_926601
_eauthor.
700 1 _aSinha, Satyabroto.
_926602
_eauthor.
830 0 _aFrontiers in electronic testing
_vv. 30
_926603
856 _3Abstract
_uhttp://repository.fue.edu.eg/xmlui/handle/123456789/3919
942 _cBK
_2ddc