| 000 | 01920cam a22003617i 4500 | ||
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| 999 |
_c5594 _d5594 |
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| 001 | 13786165 | ||
| 005 | 20210317142501.0 | ||
| 008 | 041118s2005 gw a f b 001 0 eng d | ||
| 010 | _a 2004116726 | ||
| 020 | _a9788181288073 | ||
| 020 | _a354020198x | ||
| 040 |
_aOHX _cOHX _dOCLCQ _dBGU _dDLC _erda |
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| 082 | 0 | 0 |
_a621.395 _bC.G.V _222 |
| 100 | 1 |
_aCampardo, Giovanni. _eauthor. |
|
| 245 | 1 | 0 |
_aVLSI-design of non-volatile memories / _cGiovanni Campardo, Rino Micheloni, David Novosel. |
| 246 | 3 | 0 | _aVery large scale integrated design of non-volatile memories |
| 264 | 1 |
_aBerlin ; _aNew York : _bSpringer, _c[2005] |
|
| 264 | 4 | _c©2005 | |
| 300 |
_axxviii, 581 pages : _billustrations ; _c24 cm |
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| 336 |
_2rdacontent _atext |
||
| 337 |
_2rdamedia _aunmediated |
||
| 338 |
_2rdacarrier _avolume |
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| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | _aNon-Volatile Memory Design -- Process Aspects -- The MOSFET Transistor and the Memory Cell -- Passive Components -- Fundamental Circuit Blocks -- The Organization of the Memory Array -- The Input Buffer – Decoders – Boost -- Synchronization Circuits -- Reading Circuits -- Multilevel Read -- Program and Erase Algorithms -- Circuits Used in Program and Erase Operations -- High-Voltage Management System -- Program and Erase Controller -- Redundancy and Error Correction Codes -- The Output Buffer -- Test Modes -- ESD & Latch-Up -- From Specification Analysis to Floorplan Definition -- Photo Album | |
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration. |
|
| 700 | 1 |
_aMicheloni, Rino. _eauthor. |
|
| 700 | 1 |
_aNovosel, David. _eauthor. |
|
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0662/2004116726-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0816/2004116726-t.html |
| 942 |
_cBK _2ddc |
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