| 000 | 01777cam a2200421 i 4500 | ||
|---|---|---|---|
| 999 |
_c8203 _d8203 |
||
| 001 | 15092871 | ||
| 003 | EG-NcFUE | ||
| 005 | 20201228114014.0 | ||
| 008 | 071126s2008 ne a b 001 0 eng | ||
| 010 | _a 2007048527 | ||
| 015 |
_aGBA7A1296 _2bnb |
||
| 016 | 7 |
_a014469115 _2Uk |
|
| 020 | _a0123695295 | ||
| 020 | _a9780123695291 | ||
| 035 | _a(OCoLC)ocn176924795 | ||
| 035 | _a(OCoLC)176924795 | ||
| 040 |
_aDLC _cDLC _dBTCTA _dYDXCP _dBAKER _dUKM _dC#P _dDLC |
||
| 050 | 0 | 0 |
_aTK7874 _b.M86143 2008 |
| 082 | 0 | 0 |
_a621.3815 _222 _bM.S.R |
| 100 | 1 |
_aMukherjee, Shubu. _eauthor. |
|
| 245 | 1 | 0 |
_aArchitecture design for soft errors / _cShubu Mukherjee. |
| 264 | 1 |
_aAmsterdam ; _aBoston : _bMorgan Kaufmann Publishers/Elsevier, _c[2008] |
|
| 264 | 4 | _c©2008 | |
| 300 |
_axxi, 337 pages : _billustrations ; _c25 cm |
||
| 336 |
_2rdacontent _atext |
||
| 337 |
_2rdamedia _aunmediated |
||
| 338 |
_2rdacarrier _avolume |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | _a1. Introduction -- 2. Device- and Circuit-Level Modeling, Measurement and Mitigation -- 3. Architectural Vulnerability Analysis -- 4. Advanced Architectural Vulnerability Analysis -- 5. Error Coding Techniques -- 6. Fault Detection via Redundant Execution -- 7. Hardware Error Recovery -- 8. Software Detection and Recovery. | |
| 650 | 0 | _aIntegrated circuits. | |
| 650 | 0 |
_aIntegrated circuits _xEffect of radiation on. |
|
| 650 | 0 | _aComputer architecture. | |
| 650 | 0 | _aSystem design. | |
| 856 | 4 | 1 |
_3Abstract _uhttp://repository.fue.edu.eg/xmlui/handle/123456789/3992 |
| 906 |
_a7 _bcbc _corignew _d1 _eecip _f20 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||