| 000 | 01679pam a2200349 i 4500 | ||
|---|---|---|---|
| 999 |
_c8888 _d8888 |
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| 001 | 4906833 | ||
| 003 | EG-NcFUE | ||
| 005 | 20201228130916.0 | ||
| 008 | 940707s2010 maua b 001 0 eng | ||
| 020 | _a9781606500415 (hb) | ||
| 020 | _a1606500414 (hb) | ||
| 020 | _a9781606500439 (ebk.) | ||
| 020 | _a1606500430 (ebk.) | ||
| 040 |
_aDLC _cDLC _dDLC _efue |
||
| 082 | 0 | 0 |
_a621.38152 _222 _bC. |
| 245 | 0 | 0 |
_aCharacterization in compound semiconductor processing / _ceditors, Yale Strausser and Gary E. McGuire ; consulting editor, C.R. Brundle ; managing editor, Lee E. Fitzpatrick. |
| 264 | 1 |
_aBoston : _bButterworth-Heinemann ; _aGreenwich : _bManning, _c[2010] |
|
| 264 | 1 | _cc2010. | |
| 300 |
_axiv, 199 pages : _billustartions ; _c25 cm. |
||
| 336 |
_atext _2rdacontent |
||
| 337 |
_aunmediated _2rdamedia |
||
| 338 |
_avolume _2rdacarrier |
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| 490 | 0 | _aMaterials characterization series | |
| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 |
_tCharacterization of III-V thin films for electronic devices /
_rJ.N. Miller and T.S. Low -- _tIII-V compound semiconductor films for optical applications / _rThomas F. Kuech -- _tContacts / _rT. Sands and S.A. Schwarz -- _tDielectric insulating layers / _rH.H. Wieder -- _tOther compound semiconductor films / _rOwen K. Wu and David R. Rhiger -- _tDeep level transient spectroscopy : a case study on GaAs / _rWerner K. Götz and Noble M. Johnson. |
|
| 650 | 0 | _aCompound semiconductors. | |
| 650 | 0 |
_aCompound semiconductors _xSurfaces. |
|
| 700 | 1 |
_aStrausser, Yale, _eeditor. |
|
| 700 | 1 |
_aMcGuire, G. E. _eeditor. |
|
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
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