Fault diagnosis of analog integrated circuits / by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha.

By:

Kabisatpathy, Prithviraj [author.]

Contributor(s):

Material type: Text

TextSeries: Frontiers in electronic testing ; v. 30Publisher: Dordrecht : Springer, [2005]Description: ix, 182 pages : illustrations ; 25 cmContent type:

text

Media type:

unmediated

Carrier type:

volume

ISBN:

038725742X (hd.bd.)

Subject(s):

DDC classification:

621.3815 22 K.P.F

LOC classification:

TK7874.654 .K335 2005

Online resources:

Abstract

Contents:

Introduction -- Basic test issues -- Introduction -- A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme -- Introduction -- The diagnosis procedure -- The test stimulus generation -- The fault modelling -- Approximation modelling of the analogue integrated circuits -- Artificial neural networks: an overview -- Summary and conclusions -- Fault Diagnosis in Stand-alone Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained -- Fault Diagnosis in Embedded Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained -- Experimental Verification of the Fault Diagnosis Methodology -- Introduction -- The hardware realisation -- Experimental results -- Discussion on the results obtained -- Conclusions -- Results and discussions -- Appendix. A.Typical BJT SPICE parameter values of the µA741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp -- Bibliography.

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Item type	Current library	Collection	Call number	Status	Date due	Barcode
Books	Main library B3	Faculty of Engineering & Technology (Electrical)	621.3815 K.P.F (Browse shelf(Opens below))	Available		00005486

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Includes bibliographical references and index.

Introduction -- Basic test issues -- Introduction -- A review of analogue fault diagnosis -- Fault Diagnosis of Analogue Circuits using Model-based Observer Scheme -- Introduction -- The diagnosis procedure -- The test stimulus generation -- The fault modelling -- Approximation modelling of the analogue integrated circuits -- Artificial neural networks: an overview -- Summary and conclusions -- Fault Diagnosis in Stand-alone Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained --
Fault Diagnosis in Embedded Analogue Integrated Circuits -- Introduction -- The testing methodology -- Simulation results -- Discussion on the results obtained -- Experimental Verification of the Fault Diagnosis Methodology -- Introduction -- The hardware realisation -- Experimental results -- Discussion on the results obtained -- Conclusions -- Results and discussions -- Appendix. A.Typical BJT SPICE parameter values of the µA741 Op-Amp. B.Typical MOSFET SPICE parameter values of the MOS Op-Amp -- Bibliography.

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