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Design-for-test for digital IC's and embedded core systems /

Crouch, Alfred L.

Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch. - xxvii, 349 pages : illustrations ; 25 cm. + 1 computer laser optical disc (4 3/4 inch)

Includes bibliographical references and index.

1. Test and Design-for-Test Fundamentals. -- 2. Automatic Test Pattern Generation Fundamentals -- 3. Scan Architectures and Techniques -- 4. Memory Test Architectures and Techniques. -- 5. Embedded Core Test Fundamentals.


System requirements for accompanying computer disc: UNIX ; Microsoft Windows.

0130848271


Digital integrated circuits--Design and construction.
Electronic circuit design.
Automatic test equipment.
Embedded computer systems--Design and construction.

621.3815 / C.A.D