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Design-for-test for digital IC's and embedded core systems / (Record no. 2369)

MARC details
000 -LEADER
fixed length control field 01645cam a22003494i 4500
001 - CONTROL NUMBER
control field 2630293
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20210125135342.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 990416s1999 njua b 001 0 eng
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0130848271
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Description conventions rda
Transcribing agency DLC
Modifying agency DLC
Language of cataloging eng
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 21
Item number C.A.D
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Crouch, Alfred L.
9 (RLIN) 9777
Relator term author.
245 10 - TITLE STATEMENT
Title Design-for-test for digital IC's and embedded core systems /
Statement of responsibility, etc Alfred L. Crouch.
264 #1 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Upper Saddle River, NJ :
Name of publisher, distributor, etc Prentice Hall PTR,
Date of publication, distribution, etc [1999]
264 #4 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Date of publication, distribution, etc ©1999
300 ## - PHYSICAL DESCRIPTION
Extent xxvii, 349 pages :
Other physical details illustrations ;
Dimensions 25 cm. +
Accompanying material 1 computer laser optical disc (4 3/4 inch)
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term unmediated
Media type code n
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term volume
Carrier type code nc
Source rdacarrier
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note 1. Test and Design-for-Test Fundamentals. -- 2. Automatic Test Pattern Generation Fundamentals -- 3. Scan Architectures and Techniques -- 4. Memory Test Architectures and Techniques. -- 5. Embedded Core Test Fundamentals.
538 ## - SYSTEM DETAILS NOTE
System details note System requirements for accompanying computer disc: UNIX ; Microsoft Windows.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Digital integrated circuits
General subdivision Design and construction.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Electronic circuit design.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Automatic test equipment.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Embedded computer systems
General subdivision Design and construction.
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 7
b cbc
c orignew
d 1
e ocip
f 19
g y-gencatlg
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Books
Holdings
Lost status Source of classification or shelving scheme Damaged status Not for loan Collection code Home library Current library Shelving location Date acquired Source of acquisition Cost, normal purchase price Inventory number Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
  Dewey Decimal Classification     Faculty of Engineering & Technology (Electrical) Main library Main library B3 07/08/2007 American university 60.00 PU   621.3815 C.A.D 00004587 19/02/2025 21/09/2010 Books
  Dewey Decimal Classification     Faculty of Engineering & Technology (Electrical) Main library Main library B3 07/08/2007 American university 60.00 PU   621.3815 C.A.D 00004586 19/02/2025 21/09/2010 Books