MARC details
| 000 -LEADER |
| fixed length control field |
01645cam a22003494i 4500 |
| 001 - CONTROL NUMBER |
| control field |
2630293 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
| control field |
20210125135342.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
| fixed length control field |
990416s1999 njua b 001 0 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
| International Standard Book Number |
0130848271 |
| 040 ## - CATALOGING SOURCE |
| Original cataloging agency |
DLC |
| Description conventions |
rda |
| Transcribing agency |
DLC |
| Modifying agency |
DLC |
| Language of cataloging |
eng |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
| Classification number |
621.3815 |
| Edition number |
21 |
| Item number |
C.A.D |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
| Personal name |
Crouch, Alfred L. |
| 9 (RLIN) |
9777 |
| Relator term |
author. |
| 245 10 - TITLE STATEMENT |
| Title |
Design-for-test for digital IC's and embedded core systems / |
| Statement of responsibility, etc |
Alfred L. Crouch. |
| 264 #1 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
| Place of publication, distribution, etc |
Upper Saddle River, NJ : |
| Name of publisher, distributor, etc |
Prentice Hall PTR, |
| Date of publication, distribution, etc |
[1999] |
| 264 #4 - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
| Date of publication, distribution, etc |
©1999 |
| 300 ## - PHYSICAL DESCRIPTION |
| Extent |
xxvii, 349 pages : |
| Other physical details |
illustrations ; |
| Dimensions |
25 cm. + |
| Accompanying material |
1 computer laser optical disc (4 3/4 inch) |
| 336 ## - CONTENT TYPE |
| Content type term |
text |
| Content type code |
txt |
| Source |
rdacontent |
| 337 ## - MEDIA TYPE |
| Media type term |
unmediated |
| Media type code |
n |
| Source |
rdamedia |
| 338 ## - CARRIER TYPE |
| Carrier type term |
volume |
| Carrier type code |
nc |
| Source |
rdacarrier |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
| Bibliography, etc |
Includes bibliographical references and index. |
| 505 0# - FORMATTED CONTENTS NOTE |
| Formatted contents note |
1. Test and Design-for-Test Fundamentals. -- 2. Automatic Test Pattern Generation Fundamentals -- 3. Scan Architectures and Techniques -- 4. Memory Test Architectures and Techniques. -- 5. Embedded Core Test Fundamentals. |
| 538 ## - SYSTEM DETAILS NOTE |
| System details note |
System requirements for accompanying computer disc: UNIX ; Microsoft Windows. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name as entry element |
Digital integrated circuits |
| General subdivision |
Design and construction. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name as entry element |
Electronic circuit design. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name as entry element |
Automatic test equipment. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
| Topical term or geographic name as entry element |
Embedded computer systems |
| General subdivision |
Design and construction. |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) |
| a |
7 |
| b |
cbc |
| c |
orignew |
| d |
1 |
| e |
ocip |
| f |
19 |
| g |
y-gencatlg |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
Books |