Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.
Material type:
TextPublisher: Upper Saddle River, NJ : Prentice Hall PTR, [1999]Copyright date: ©1999Description: xxvii, 349 pages : illustrations ; 25 cm. + 1 computer laser optical disc (4 3/4 inch)Content type: - text
- unmediated
- volume
- 0130848271
- 621.3815 21 C.A.D
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | |
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Books
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Main library B3 | Faculty of Engineering & Technology (Electrical) | 621.3815 C.A.D (Browse shelf(Opens below)) | Available | 00004587 | ||
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Books
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Main library B3 | Faculty of Engineering & Technology (Electrical) | 621.3815 C.A.D (Browse shelf(Opens below)) | Available | 00004586 |
Includes bibliographical references and index.
1. Test and Design-for-Test Fundamentals. -- 2. Automatic Test Pattern Generation Fundamentals -- 3. Scan Architectures and Techniques -- 4. Memory Test Architectures and Techniques. -- 5. Embedded Core Test Fundamentals.
System requirements for accompanying computer disc: UNIX ; Microsoft Windows.
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